Udemy - Semiconductor Academy 2 Intro to Wafer Level Reliability

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Free Download Udemy - Semiconductor Academy 2 Intro to Wafer Level Reliability
Published: 4/2025
MP4 | Video: h264, 1280x720 | Audio: AAC, 44.1 KHz, 2 Ch
Language: English | Duration: 30m | Size: 238 MB
FEOL/BEOL Process Qualification, MOSFET/CMOS Reliability, Foundry/IC design house, Semiconductor Device

What you'll learn
practical wafer level reliability knowledges in semiconductor foundry.
Contribute to the development of reliable semiconductor process and device.
Gain hands-on knowledge of industry standards and process qualification items.
Learn key reliability concepts and methods.
Requirements
basic semiconductor process/reliability concepts
Description
This course provides a comprehensive Overview of wafer level reliability and qualification for semiconductor process and devices. You'll learn critical concepts, industry standards, and best practices, equipping you with the state-of-the-art knowledge and skills to design, test, and qualify reliable process/transistor for the semiconductor foundries.What you will learn in this class ? FEOL/BEOL Process Qualification, we will teach you how to qualify process/device with the corresponding Industry Standard. Lifetime Models: you will learn the methods to predict transistor life under real-world conditions. We will show you the typical MOSFET reliability failure mechanisms. Wafer Level Reliability: including TDDB (time dependent dielectric breakdown), Gox VBD (gate oxide breakdown voltage), Defect Modes, PID (plasma induced damage), BTI (bias temeperature instability), HCI (hot carrier injection), EM (electromigration), SM (stress migration). Concepts of Aging Model and Aging SimulationCourse Objectives: Understand the importance of reliability in the semiconductor industry.Learn key reliability concepts and methods.Gain hands-on knowledge of industry standards and test procedures.Learning Outcomes: Apply reliability principles to your work.Perform effective reliability testing and design/choose applicable test condition. Contribute to the development of reliable transistor reliability. This course covered key concepts, industry standards, and best practices for wafer level reliability and qualification of semiconductor process.
Who this course is for
Reliability engineers who aim to work in Tier-1 Foundry/IC design house, ex. Intel/TSMC/Samsung/GF/UMC/...
Product/Process Engineer
(Supplier) Quality Engineer
Failure Analysis Engineer
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237.72 MB | 3min 35s | mp4 | 1280X720 | 16:9
Genre:eLearning |Language:English​

Files Included :

Spoiler

FileName :1 -Introduction.mp4 | Size: (4.83 MB)
FileName :2 -Bathtub curve v s Qualification in Foundry.mp4 | Size: (7.72 MB)
FileName :3 -What is WLR & the Importance.mp4 | Size: (11.94 MB)
FileName :4 -What WLR includes.mp4 | Size: (9.96 MB)
FileName :1 -FEOL Process Qualification.mp4 | Size: (4.61 MB)
FileName :2 -TDDB (Time Dependent Dielectric Breakdown) & Lifetime Model.mp4 | Size: (21.02 MB)
FileName :3 -Gox VBD (Gate Oxide Breakdown Voltage) & Defect Modes.mp4 | Size: (21.56 MB)
FileName :4 -PID (Plasma Induced Damage).mp4 | Size: (19.47 MB)
FileName :5 -HCI (Hot Carrier Injection) & Lifetime Model.mp4 | Size: (22.82 MB)
FileName :6 -BTI (Bias Temperature Instability) & Lifetime Model.mp4 | Size: (21.72 MB)
FileName :1 -BEOL Process Qualification.mp4 | Size: (4.42 MB)
FileName :2 -EM (Electro-Migration) & Lifetime Model.mp4 | Size: (28.66 MB)
FileName :3 -Quiz EM test resultlifetime model practice.mp4 | Size: (11.49 MB)
FileName :4 -SM (Stress Migration).mp4 | Size: (15.49 MB)
FileName :1 -Summary of Device Reliability Failure Mechanisms.mp4 | Size: (16.3 MB)
FileName :2 -End-to-End from WLR to Aging ModelSimulation to CLR.mp4 | Size: (6.5 MB)
FileName :1 -Ending Appreciation & Forecast.mp4 | Size: (9.2 MB)

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